Reionization optical depth determination from Planck HFI data with ten percent accuracy
Reionization optical depth determination from Planck HFI data with ten percent accuracy
复制标题
根据普朗克 HFI 数据确定再电离光学深度,精度为 10%
DOI:
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发表时间:
2019
影响因子:
6.5
通讯作者:
L. Vibert
中科院分区:
文献类型:
--
作者:
L. Pagano;J. Delouis;S. Mottet;J. Puget;L. Vibert
We present an estimation of the reionization optical depth τ from an improved analysis of data from the High Frequency Instrument (HFI) on board the Planck satellite. By using an improved version of the HFI map-making code, we greatly reduce the residual large-scale contamination affecting the data, characterised in, but not fully removed from, the Planck 2018 legacy release. This brings the dipole distortion systematic effect, contaminating the very low multipoles, below the noise level. On large-scale polarization-only data, we measure τ = 0.0566−0.0062+0.0053 at 68% C.L., reducing the Planck 2018 legacy release uncertainty by ∼40%. Within the ΛCDM model, in combination with the Planck large-scale temperature likelihood, and the high-ℓ temperature and polarization likelihood, we measure τ = 0.059 ± 0.006 at 68% C.L., which corresponds to a mid-point reionization redshift of zre = 8.14 ± 0.61 at 68% C.L. This estimation of the reionization optical depth with 10% accuracy is the strongest constraint to date.
影响因子:
8.7
作者:
Komatsu, E.;Smith, K. M.;Wright, E. L.
通讯作者:
Wright, E. L.
DOI:
10.17863/cam.43425
发表时间:
2016
期刊:
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影响因子:
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作者:
Aghanim N
通讯作者:
Aghanim N