One Bit is (Not) Enough: An Empirical Study of the Impact of Single and Multiple Bit-Flip Errors
One Bit is (Not) Enough: An Empirical Study of the Impact of Single and Multiple Bit-Flip Errors
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一位就足够了：单个和多个位翻转错误影响的实证研究
DOI：
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发表时间：
2017
期刊：
影响因子：
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通讯作者：
J. Karlsson
中科院分区：
文献类型：
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作者：
B. Sangchoolie;K. Pattabiraman;J. Karlsson
最近的研究表明，技术和电压缩放预计将增加粒子引起的软错误表现为多位错误的可能性。这引起了人们对使用单个位翻转来评估故障注入实验中软错误的影响的有效性的关注。本文的目标是调查多位错误是否会导致更高比例的无声数据损坏（SDC）相比，单位错误。基于2700故障注入活动与15个基准程序，具有总共2700万次实验，我们的研究结果表明，在大多数情况下，单比特错误产生更高比例的SDCs相比，多比特错误。然而，在8%的活动中，我们观察到多位错误的SDC百分比更高。对于大多数这些活动，最高百分比的SDC是通过翻转最多3位获得的。此外，我们提出了三种方法修剪误差空间的基础上的结果。
Recent studies have shown that technology and voltage scaling are expected to increase the likelihood that particle-induced soft errors manifest as multiple-bit errors. This raises concerns about the validity of using single bit-flips for assessing the impact of soft errors in fault injection experiments. The goal of this paper is to investigate whether multiple-bit errors could cause a higher percentage of silent data corruptions (SDCs) compared to single-bit errors. Based on 2700 fault injection campaigns with 15 benchmark programs, featuring a total of 27 million experiments, our results show that single-bit errors in most cases yields a higher percentage of SDCs compared to multiple-bit errors. However, in 8% of the campaigns we observed a higher percentage of SDCs for multiple-bit errors. For most of these campaigns, the highest percentage of SDCs was obtained by flipping at most 3 bits. Moreover, we propose three ways of pruning the error space based on the results.