Thickness-Dependence of Surface Reconstruction on the (001) Surface of Ultrathin Silicon Nanosheets by Density Functional Tight Binding Simulations
Thickness-Dependence of Surface Reconstruction on the (001) Surface of Ultrathin Silicon Nanosheets by Density Functional Tight Binding Simulations
复制标题
通过密度泛函紧结合模拟实现超薄硅纳米片 (001) 表面表面重构的厚度依赖性
DOI：
10.1166/sam.2021.3926
复制
发表时间：
2021-03
影响因子：
0.9
通讯作者：
Yang Qi
中科院分区：
文献类型：
--
作者：
Lijun Wu;Baoqian Chi;Longhai Shen;Lin Zhang;Yang Qi
The influences of the thickness of ultrathin Si nanosheets on the (001) surface morphologies and charge distribution were identified by using density functional tight binding (DFTB) simulations. The differences in structure and electronic properties were
