Investigation of atomic species in Pt-induced nanowires on Ge(001) surface by combined atomic force and scanning tunneling microscopy
Investigation of atomic species in Pt-induced nanowires on Ge(001) surface by combined atomic force and scanning tunneling microscopy
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结合原子力和扫描隧道显微镜研究 Ge(001) 表面 Pt 诱导纳米线中的原子种类
DOI：
10.1103/physrevb.96.155415
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发表时间：
2017
影响因子：
3.7
通讯作者：
Yurtsever Ayhan
中科院分区：
文献类型：
--
作者：
Inami Eiichi;Sugimoto Yoshiaki;Shinozaki Takuya;Gurlu Oguzhan;Yurtsever Ayhan
我们结合扫描隧道显微镜 (STM) 和原子力显微镜 (AFM) 研究了在 Ge(001) 表面自组装的 Pt 诱导纳米线中原子种类的识别。顶部原子链中取代的少量 Sn 原子被用作识别目标原子种类的参考。在 Sn 取代的纳米线上单个原子上方获取的力谱数据表明，Sn 上方的最大吸引力与原始链原子之间的比率表现出 0.86 的恒定值。获得的比率与 Sn 和 Ge 原子之间的比率相同，强烈表明 Pt 诱导的纳米线的顶脊由 Ge 二聚体组成。我们的研究结果还表明，AFM 化学识别方法可用于识别表面上的未知原子种类，而不管原子成分的均匀性如何，但迄今为止尚未得到解决。
We have studied identification of atomic species in Pt-induced nanowires self-assembled on the Ge(001) surface by combining scanning tunneling microscopy (STM) and atomic force microscopy (AFM). A small number of Sn atoms substituted in the top atomic chains were utilized as references to identify the target atomic species. Force spectroscopy data taken above single atoms on the Sn-substituted nanowires showed that the ratio between the maximum attractive forces above the Sn and the pristine chain atoms exhibited a constant value of 0.86. The obtained ratio was identical to that between Sn and Ge atoms, strongly suggestive that the top ridge of the Pt-induced nanowire was composed of Ge dimers. Our findings also demonstrate that AFM chemical identification method can be used to identify the unknown atomic species on surfaces, regardless of the homogeneity in the atomic composition, which has not been addressed so far.