Fault Detection of Analog Circuits Using Network Parameters
Fault Detection of Analog Circuits Using Network Parameters
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DOI:
10.1007/s10836-012-5284-5
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发表时间:
2012-04
期刊:
影响因子:
--
通讯作者:
A. Kavithamani;V. Manikandan;N. Devarajan
中科院分区:
文献类型:
--
作者:
A. Kavithamani;V. Manikandan;N. Devarajan
A new method to detect component faults in analog circuits is proposed in this paper. Network parameters like driving point impedance, transfer impedance, voltage gain and current gain are used to detect component faults in analog circuits as these network parameters are sensitive to the components of the circuit. Using montecarlo simulation each component of the circuit is varied within its tolerance limit and the minimum and the maximum values of each network parameter are found for fault free circuit. At the time of testing, the network parameters are found for the injected fault and if any one or more network parameters is exceeding its predetermined bound limits then the circuit is confirmed faulty. The proposed method is validated through second order Sallenkey band pass filter and fourth order Chebyshev low pass filter circuits. Numerical results are presented to clarify the proposed method and prove its efficiency.