AUTOMATIC MEASUREMENT OF COMPLEX DIELECTRIC-CONSTANT AND PERMEABILITY AT MICROWAVE-FREQUENCIES
AUTOMATIC MEASUREMENT OF COMPLEX DIELECTRIC-CONSTANT AND PERMEABILITY AT MICROWAVE-FREQUENCIES
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DOI：
10.1109/proc.1974.9382
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发表时间：
1974-01-01
影响因子：
20.6
通讯作者：
WEIR, WB
中科院分区：
文献类型：
--
作者：
WEIR, WB
随着计算机和自动测试设备的出现，可以考虑测量复杂介电常数（ε）和磁导率（μ）的新技术。描述了这种技术，其中采用了自动测量当材料样本插入波导或 TEM 传输线时产生的复反射和透射系数的系统。给出了两种常见材料的 ε 和 µ 测量结果。
With the advent of the computer and automatic test equipment, new techniques for measuring complex dielectric constant (ε) and permeability (µ) can be considered. Such a technique is described where a system is employed that automatically measures the complex reflection and transmission coefficients that result when a sample of material is inserted in waveguide or a TEM transmission line. Measurement results of ε and µ for two common materials are presented.