Correlation between subgrains and coherently scattering domains
Correlation between subgrains and coherently scattering domains
复制标题
DOI：
10.1154/1.2135313
复制
发表时间：
2005-12-01
影响因子：
0.5
通讯作者：
Hellmig, RJ
中科院分区：
文献类型：
--
作者：
Ung치r, T;Tichy, G;Hellmig, RJ
通过X射线线形分析确定的微晶尺寸通常小于通过透射电子显微镜获得的晶粒或亚晶粒尺寸，特别是当材料通过塑性变形产生时。结果表明，除了晶粒或亚晶粒之间的取向差异，偶极位错壁没有取向差异也打破了X射线散射的相干性。这意味着由X射线线轮廓分析提供的相干散射域尺寸提供了由位错边界或偶极壁界定的亚晶粒或晶胞尺寸。(C)2005年国际衍射数据中心。
Crystallite size determined by X-ray line profile analysis is often smaller than the grain or subgrain size obtained by transmission electron microscopy, especially when the material has been produced by plastic deformation. It is shown that besides differences in orientation between grains or subgrains, dipolar dislocation walls without differences in orientation also break down coherency of X-rays scattering. This means that the coherently scattering domain size provided by X-ray line profile analysis provides subgrain or cell size bounded by dislocation boundaries or dipolar walls. (C) 2005 International Centre for Diffraction Data.