L1/sub 0/ Fe-Pt on nanocrystalline HITPERM soft magnetic underlayer for perpendicular recording media

L1/sub 0/ Fe-Pt on nanocrystalline HITPERM soft magnetic underlayer for perpendicular recording media
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用于垂直记录介质的纳米晶 HITPERM 软磁底层上的 L1/sub 0/ Fe-Pt

DOI:
10.1109/tmag.2004.832464
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发表时间:
2004
影响因子:
2.1
通讯作者:
D. Laughlin
D. Laughlin
中科院分区:
工程技术4区
文献类型:
--
作者:
S. Kumar;A. Roy;D. Laughlin

文献摘要

被引文献

相似文献

在HITPERM软磁衬底上制备了[002]垂直取向的Fe-Pt薄膜。在室温下制备HITPERM底层膜之后,在一定温度范围内原位沉积Cr晶种层(20-80 nm)、Pt缓冲层(μ m/3 nm)和Fe-Pt记录层(8-30 nm)。在/spl sim/250-280/spl deg/C下获得所需的Cr [200]织构。当Cr籽晶层为[200]取向时,厚(80 nm)Cr膜促进厚(30 nm)Fe-Pt膜的[002]取向,而薄(20 nm)Cr膜促进薄(8 nm)Fe-Pt膜的[002]织构。在沉积状态下,Fe-Pt薄膜表现出不完全有序的L1/sub 0/相。对这些薄膜进行的结构研究,以及从HITPERM软磁底层薄膜获得的畴图像,将在这里介绍。
Fe-Pt films with [002] perpendicular orientation have been prepared on HITPERM soft magnetic underlayers. Subsequent to preparing the HITPERM underlayer film at room temperature, Cr seed layers (20-80 nm), Pt buffer layers (/spl sim/3 nm), and Fe-Pt recording layers (8-30 nm) were sputter-deposited in-situ over a range of temperatures. The desired Cr [200] texture was obtained at /spl sim/250-280/spl deg/C. With the Cr seed layer [200] oriented, thick (80 nm) Cr films were seen to promote [002] orientation in thick (30 nm) Fe-Pt films, whereas thin (20 nm) Cr films promoted better [002] texture in thin (8 nm) Fe-Pt films. In the as-deposited state, the Fe-Pt films exhibited incomplete ordering to the L1/sub 0/ phase. Structural studies performed on these films, as well as domain images obtained from the HITPERM soft magnetic underlayer films, will be presented here.