Design reflection for optimal test-chip implementation
Design reflection for optimal test-chip implementation
复制标题
最佳测试芯片实施的设计反思
DOI：
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发表时间：
2015
期刊：
影响因子：
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通讯作者：
Z. Liu
中科院分区：
文献类型：
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作者：
R. D. Blanton;Ben Niewenhuis;Z. Liu
最近，一种新型的逻辑表征载体（LCV）被描述为卡内基-梅隆逻辑表征载体（CM-LCV），它可以优化良率学习的设计、测试和诊断。CM-LCV是一种类似产品的测试芯片，它使用恒定可测试性理论和规则来创建参数化设计，目标是产品设计或设计系列的物理特性。CM-LCV的逻辑功能是，通过构建，设计为表现出近乎最佳的测试和诊断特性。然而，物理特性应该反映在实际的客户设计中。在这项工作中，我们描述了一种独特而直接的方法来测量设计的物理特性，更重要的是如何将这些相同的特性强加或反映到CM-LCV中。使用基准和工业设计的实验证明了这种方法的有效性。具体来说，我们开发了一个流程，使用可用的工具，可以在很短的时间内自动合成可扩展的CM-LCV，具有与产品设计几乎相同的标准细胞特性。例如，在最好的情况下，我们展示了可扩展CM-LCV的完整设计，该设计与一系列基准设计的标准单元使用相匹配，在大约2小时的计算时间内误差小于0.25%。
A new type of logic characterization vehicle (LCV) that optimizes design, test, and diagnosis for yield learning has been recently described and is called the Carnegie-Mellon Logic Characterization Vehicle (CM-LCV). The CM-LCV is a product-like test chip that uses constant-testability theory and regularity to create a parameterized design that targets the physical characteristics of a product design or family of designs. The logic function of the CM-LCV is, by construction, designed to exhibit near-optimal test and diagnosis characteristics. The physical characteristics however should reflect those found in actual customer designs. In this work, we describe a unique and straight-forward methodology for measuring the physical characteristics of a design and more importantly how to impose or reflect those same characteristics into a CM-LCV. Experiments using both benchmark and industrial designs demonstrate the efficacy of this approach. Specifically, we develop a flow using available tools that can automatically synthesize a scalable CM-LCV in very little time with standard-cell characteristics that are nearly identical to product designs. For example, in the best case, we demonstrate the complete design of a scalable CM-LCV that matches the standard-cell usage of a family of benchmark designs with less than 0.25% error in about 2 hours of compute time.