Precise measurements of optical dispersion using a new interferometric technique.
Precise measurements of optical dispersion using a new interferometric technique.
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使用新的干涉技术精确测量光色散。
DOI：
10.1364/ao.25.001344
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发表时间：
1986
期刊：
影响因子：
1.9
通讯作者：
D. Eimerl
中科院分区：
文献类型：
--
作者：
S. Velsko;D. Eimerl
本文叙述了用非线性干涉仪测量折射率色散的方法。将待测光学材料的样品置于两个光学非线性晶体之间，并使中等强度的激光通过组合。通过观察两个非线性晶体中产生的二次谐波之间的干涉，可以非常精确地确定样品在激光频率和其二次谐波频率下的折射率之间的差异。我们已经使用该干涉仪测量了几种气体在1064和532 nm之间的色散。我们也用它来确定两个透明固体的色散。该方法可以测量折射率差优于0.1%，对于氦气等气体，绝对精度为10−9。
Measurements of the dispersion of the refractive index using a nonlinear interferometer are described. A sample of the optical material to be measured is interposed between two optically nonlinear crystals, and a moderately intense laser is passed through the combination. By observing the interference between the second harmonics produced in the two nonlinear crystals, the difference between the refractive indices of the sample at the laser frequency and its second harmonic frequency can be determined very precisely. We have used the interferometer to measure the dispersion in several gases between 1064 and 532 nm. We have also used it to determine the dispersion of two transparent solids. The method can measure the index difference to better than 0.1%, which for gases such as helium represents an absolute accuracy of ∼10−9.