Evidence of Dirac fermions in multilayer silicene

Evidence of Dirac fermions in multilayer silicene
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DOI:
10.1063/1.4802782
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发表时间:
2013-04-22
影响因子:
4
通讯作者:
Le Lay, Guy
Le Lay, Guy
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
De Padova, Paola;Vogt, Patrick;Le Lay, Guy

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多层硅烯是多层石墨烯的硅类似物,生长在银 (111) 表面上,具有蜂窝状(根 3 x 根 3)R30 度重建,通过扫描隧道显微镜在室温下观察到,超过了主要的 3 x 3 重建硅烯单层的初始形成。对于几层硅烯薄膜,我们通过同步辐射光电子能谱进行测量,由于能带折叠,在布里渊区中心出现锥状色散。 pi* 和 pi 态在费米能级以下大约 0.25 eV 处相遇,为无带隙狄拉克费米子的存在提供了明确的证据。 (C) 2013 AIP 出版有限责任公司 [http://dx.doi.org/10.1063/1.4802782]
Multilayer silicene, the silicon analogue of multilayer graphene, grown on silver (111) surfaces, possesses a honeycomb (root 3 x root 3)R30 degrees reconstruction, observed by scanning tunnelling microscopy at room temperature, past the initial formation of the dominant, 3 x 3 reconstructed, silicene monolayer. For a few layers silicene film we measure by synchrotron radiation photoelectron spectroscopy, a cone-like dispersion at the Brillouin zone centre due to band folding. pi* and pi states meet at similar to 0.25 eV below the Fermi level, providing clear evidence of the presence of gapless Dirac fermions. (C) 2013 AIP Publishing LLC [http://dx.doi.org/10.1063/1.4802782]