Misfit dislocation network in Cu/Ni multilayers and its behaviors during scratching
Misfit dislocation network in Cu/Ni multilayers and its behaviors during scratching
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DOI:
10.1016/j.tsf.2006.10.001
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发表时间:
2007-02-26
期刊:
影响因子:
2.1
通讯作者:
Yan, Li
中科院分区:
文献类型:
--
作者:
Cheng, Dong;Yan, Zhi Jun;Yan, Li
The structure and distribution of misfit dislocations at Cu-Ni interfaces and their effects on the tribological behavior of a Ni film are investigated with 3D Molecular Dynamic Simulations. The structure of misfit dislocation network at a Cu-Ni interface differs according to different crystallographic orientations of the film relative to the substrate: a triangle and square type of misfit dislocation network are observed at (111)Cu parallel to(111)Ni and (001)Cu parallel to(001)Ni interfaces respectively. They play an important role in the strengthening of Cu/Ni multilayers. During the scratching of a single asperity contact on the Ni film, the misfit dislocation network becomes a significant barrier to the glide dislocations. The plot of friction force vs. normal load when scratching on the Ni film exhibits a horizontal stage, representing the decreasing of the frictional coefficient due to the existence of the misfit dislocations network. (c) 2006 Elsevier B.V. All rights reserved.