Temperature stability of the pentacene thin-film phase
Temperature stability of the pentacene thin-film phase
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DOI:
10.1063/1.3665188
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发表时间:
2011-11-28
影响因子:
4
通讯作者:
Resel, Roland
中科院分区:
文献类型:
--
作者:
Moser, Armin;Novak, Jiri;Resel, Roland
This work presents the influence of temperatures above 300 K on the crystal structure and morphology of pentacene thin films. The thermal expansion of the unit cell and the relative amount of different phases are investigated via grazing incidence x-ray diffraction. Geometrical considerations about the specific molecular packing of the thin-film phase explain the anisotropic non-linear expansion. Furthermore, around 480 K, a phase transformation of the thin-film phase to the bulk phase is observed. In contrast, only a weak influence of the temperature on the height distribution of the thin-film phase crystallites is found. (C) 2011 American Institute of Physics. [doi:10.1063/1.3665188]