New methods for automatic quantification of microstructural features using digital image processing

New methods for automatic quantification of microstructural features using digital image processing
复制标题

DOI:
10.1016/j.matdes.2017.12.049
复制
发表时间:
2018-03-05
期刊:
影响因子:
8.4
通讯作者:
Ion, William
Ion, William
中科院分区:
材料科学1区
文献类型:
--
作者:
Campbell, Andrew;Murray, Paul;Ion, William

文献摘要

被引文献

相似文献

热和机械过程改变了材料的微观结构,这决定了材料的机械性能。这使得可靠的微观结构分析对部件的设计和制造非常重要。然而,分析复杂的微观结构,如Ti6Al4V,是困难的,通常需要专业的材料科学家手动识别和测量微观结构特征。这个过程通常是缓慢的,劳动密集型的,而且重复性差。本文通过提出一套新的二维微结构分析自动化技术来克服这些挑战。开发了数字图像处理算法,以分离单个微观结构特征,如颗粒和α板条菌落。产生图像的分割,其中区域代表颗粒和菌落,从中形态特征,如;晶粒尺寸、球状α晶粒体积分数和α集落大小均可测量。所提出的测量技术被证明可以获得与现有人工方法相似的结果,同时大大提高了速度和可重复性。通过与现有分析软件的比较,证明了该方法在测量复杂微观结构时的优势。通过改变一些参数,所提出的技术对各种微观结构类型以及SEM和光学显微镜图像都是有效的。(C) 2018年作者。Elsevier Ltd.出版。
Thermal and mechanical processes alter the microstructure of materials, which determines their mechanical properties. This makes reliable microstructural analysis important to the design and manufacture of components. However, the analysis of complex microstructures, such as Ti6Al4V, is difficult and typically requires expert materials scientists to manually identify and measure microstructural features. This process is often slow, labour intensive and suffers from poor repeatability. This paper overcomes these challenges by proposing a new set of automated techniques for 2D microstructural analysis. Digital image processing algorithms are developed to isolate individual microstructural features, such as grains and alpha lath colonies. A segmentation of the image is produced, where regions represent grains and colonies, from which morphological features such as; grain size, volume fraction of globular alpha grains and alpha colony size can be measured. The proposed measurement techniques are shown to obtain similar results to existing manual methods while drastically improving speed and repeatability. The benefits of the proposed approach when measuring complex microstructures are demonstrated by comparing it with existing analysis software. Using a few parameter changes, the proposed techniques are effective on a variety of microstructure types and both SEM and optical microscopy images. (C) 2018 The Authors. Published by Elsevier Ltd.