Dielectric and electric relaxations induced by the complex defect clusters in (Yb plus Nb) co-doped rutile TiO2 ceramics
Dielectric and electric relaxations induced by the complex defect clusters in (Yb plus Nb) co-doped rutile TiO2 ceramics
复制标题
(Yb 加 Nb) 共掺杂金红石 TiO2 陶瓷中复杂缺陷簇引起的介电和电弛豫
DOI:
10.1111/jace.14861
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发表时间:
2017
影响因子:
3.9
通讯作者:
Liu Peng
中科院分区:
文献类型:
--
作者:
Zhao Xiao gang;Liu Peng
The effect of the Yb+Nb substitution for Ti on the microstructure, crystal structures, and dielectric properties of (Yb1/2Nb1/2)xTi1−xO2(0.01≤x≤0.1) ceramics is investigated in this study. The results reveal that the solid solubility limit of the (Yb1/2Nb1/2)xTi1−xO2ceramics isx=0.07, and the average grain sizes considerably decrease from 12 μm to 6 μm withxincreasing from 0.01 to 0.1. Three types of dielectric relaxations are observed at temperature ranges of 10‐30 K, 80‐180 K, and 260‐300 K, caused by the electron‐pinned defect dipoles, polaron hopping, and interfacial polarizations, respectively. The conduction mechanism changes from nearest‐neighbor‐hopping to polaron hopping mechanism, which is confirmed by ac conductivity measurements. The present work indentifies the correlation between the colossal permittivity and polaron hopping process in the titled compound.