Development for ultraviolet vertical cavity surface emitting lasers
Development for ultraviolet vertical cavity surface emitting lasers
复制标题
DOI:
10.1117/12.2212617
复制
发表时间:
2014-07
期刊:
影响因子:
--
通讯作者:
Yuh-Shiuan Liu;T. Kao;K. Mehta;S. Shen;P. Yoder;T. Detchprohm;R. Dupuis;H. Xie;F. Ponce
中科院分区:
文献类型:
--
作者:
Yuh-Shiuan Liu;T. Kao;K. Mehta;S. Shen;P. Yoder;T. Detchprohm;R. Dupuis;H. Xie;F. Ponce
We report our current development progress of ultraviolet vertical-cavity surface-emitting lasers, which included the development of an electrically conducting n-DBR consisting of 40-pairs of Si-doped quarter-wavelength layers of Al0.12Ga0.88N and GaN. A peak reflectivity of 91.6% at 368 nm was measured and a series resistance of 17.7Ω was extracted near the maximum measured current of 100 mA. Furthermore, a micro-cavity light emitting diode was demonstrated by utilizing the established n-DBR. A 2λ cavity was subsequently grown on the 40-pair Al0.12Ga0.88N/GaN n-DBR and a peak wavelength of 371.4 nm was observed with spectral linewidth of 5.8 nm.