Development of a figure correction method having spatial resolution close to 0.1 mm
Development of a figure correction method having spatial resolution close to 0.1 mm
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开发空间分辨率接近0.1mm的图形校正方法
DOI:
10.1117/12.520825
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发表时间:
2004
期刊:
影响因子:
--
通讯作者:
T. Ishikawa
中科院分区:
文献类型:
--
作者:
Y. Mori;K. Yamauchi;K. Yamamura;H. Mimura;Y. Sano;A. Saito;K. Endo;A. Souvorov;M. Yabashi;K. Tamasaku;T. Ishikawa
A new figure correction method is applied to fabricate an elliptical mirror to realize a one-dimensionally diverging X-ray beam having high image quality. Mutual relations between figure errors and intensity uniformities of diverging X-ray beams are also investigated using a wave-optical simulator and indicate that figure errors in relatively short spatial wavelength ranges lead to high-contrast interference fringes. By using the microstitching interferometer and elastic emission machining, figure correction of an elliptical mirror with lateral resolution close to 0.1mm was carried out. A one-dimensional diverging X-ray obtained by the fabricated mirror was observed at SPring-8 and evaluated to have a sufficiently flat intensity distribution.