Dynamic Multiple Tracing with D2and C2D4in Ethylene Hydroformylation over Mn–Rh/SiO2
Dynamic Multiple Tracing with D2and C2D4in Ethylene Hydroformylation over Mn–Rh/SiO2
复制标题
Mn-Rh/SiO2 乙烯氢甲酰化反应中 D2 和 C2D4 的动态多重示踪
DOI:
--
复制
发表时间:
1998
期刊:
影响因子:
--
通讯作者:
S. Chuang
中科院分区:
文献类型:
--
作者:
M. Brundage;S. Chuang
Abstract Combined FT-IR/mass spectrometry was used to study the dynamic behavior of hydrogen/deuterium adsorbates in response to D 2 and C 2 D 4 pulses during ethylene hydroformylation on Mn–Rh/SiO 2 at 513 K and 0.1 MPa. Variation of exposure time of the catalyst to the D 2 and C 2 D 4 pulses revealed that readsorption did not play a significant role in the product responses; long exposure time allows more deuterium to enter the slower pathway of d 1 - and d 2 -propionaldehyde. The two-unequal-hump HD response from both the D 2 and C 2 D 4 pulses indicates the presence of an isotope effect on hydrogen/deuterium adsorption. The rapid responses of the deuterated ethylene and ethane can be described by the Horiuti-Polanyi mechanism and indicate that their intermediates have small θ (surface coverage) and τ (residence time) which cannot be resolved by the time resolution of their transient responses. The d 1 - and d 2 -propionaldehyde products show a two-hump response, which can be explained by the different deuterium incorporation pathways into the propionaldehyde. The first hump is due to hydrogen/deuterium exchange on adsorbed acyl and acyl hydrogenation. The second hump is due to H/D exchange on the adsorbed alkyl species, which then undergoes CO insertion and acyl hydrogenation. The second hump decay is partly due to the reaction with Si–OD as indicated by the parallel decay of d 1 - and d 2 -propionaldehyde and Si–OD.