EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany
EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany
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EMC 2008 第 14 届欧洲显微镜大会 2008 年 9 月 1-5 日，德国亚琛
DOI：
10.1007/978-3-540-85156-1_238
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发表时间：
2008
期刊：
影响因子：
--
通讯作者：
Fay M
中科院分区：
文献类型：
--
作者：
Fay M
诺丁汉纳米技术和纳米科学中心最近委托了一个电子显微镜设施，包括一个FIB-扫描电镜与低温传输系统和场发射枪透射电子显微镜配备了广泛的样品架，允许原位分析范围广泛的材料进行（图1）。这些仪器被配置为服务于生命科学和物理科学领域的广泛兴趣。
The Nottingham Nanotechnology and Nanoscience Centre has recently commissioned an electron microscopy facility comprising a FIB-SEM with cryo transfer system and a field emission gun transmission electron microscope equipped with an extensive range of sample holders that allowin situanalysis of a wide range of materials to be carried out (figure 1). These instruments are configured to serve a wide range of interests across the fields of the life sciences and physical sciences.