A Direct Evidence of Morphological Degradation on a Nanometer Scale in Polymer Solar Cells
A Direct Evidence of Morphological Degradation on a Nanometer Scale in Polymer Solar Cells
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DOI：
10.1002/adma.201302854
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发表时间：
2013-12-01
影响因子：
29.4
通讯作者：
Mueller-Buschbaum, Peter
中科院分区：
文献类型：
--
作者：
Schaffer, Christoph J.;Palumbiny, Claudia M.;Mueller-Buschbaum, Peter
利用微掠入射小角X射线散射(μ)和电流-电压跟踪技术对聚合物太阳电池进行了原位测量。在测量光照下的电学特性的同时，用μGISAXS探测了样品的形态变化。X射线束(绿色)以浅角度入射到光活化层上，并在2D探测器上散射。降解可以通过观察到的正在进行的纳米形态变化来解释。
In situ measurement of a polymer solar cell using micro grazing incidence small angle X-ray scattering (μGISAXS) and current-voltage tracking is demonstrated. While measuring electric characteristics under illumination, morphological changes are probed by μGISAXS. The X-ray beam (green) impinges on the photo active layer with a shallow angle and scatters on a 2d detector. Degradation is explained by the ongoing nanomorphological changes observed.