Carbon Nanotube Tip for Scanning Tunneling Microscope
Carbon Nanotube Tip for Scanning Tunneling Microscope
复制标题
用于扫描隧道显微镜的碳纳米管尖端
DOI：
10.1143/jjap.40.4328
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发表时间：
2001
影响因子：
1.5
通讯作者：
H. Tokumoto
中科院分区：
文献类型：
--
作者：
W. Mizutani;N. Choi;T. Uchihashi;H. Tokumoto
我们使用操作系统将多壁碳纳米管(CNT)连接到Au针尖的顶部，并将其用作扫描隧道显微镜(STM)的探针。我们用超高真空扫描隧道显微镜测量了Au(111)表面，其中Au尖端经过电化学刻蚀，多壁碳纳米管尖端附着在Au尖端。当碳纳米管尖端在线圈灯丝中加热时，我们观察到了干净的Au(111)的22×√3重构。对于未清洗的碳纳米管尖端，在重建过程中观察到许多吸附物质，这可能是从碳纳米管尖端解吸出来的污染物。碳纳米管针尖的稳定性取决于其长度、直径和与基材的接触程度。到目前为止，我们已经使用长度小于200 nm的碳纳米管获得了良好的分辨率。我们发现，当碳纳米管不垂直于样品表面时，针尖-表面的相互作用增加了碳纳米管针尖的稳定性。
We attached multiwall carbon nanotubes (CNTs) to the top of a Au tip using a manipulation system, and used the tip as a probe for a scanning tunneling microscope (STM). We measured Au(111) surfaces using an ultrahigh-vacuum-STM with an electrochemically etched Au tip and a multiwall CNT tip attached to the top of the Au tip. When the CNT tip was cleaned by heating in a coil filament, we observed the 22×√3 reconstruction of clean Au(111). With an uncleaned CNT tip, many adsorbates were observed along the reconstruction, which may be contaminants desorbed from the CNT tip. The stability of the CNT tip depends on its length, diameter and the contact to the base material. Thus far, we have obtained good resolution using a CNT with a length of less than 200 nm. We found that when the CNT was not vertical to the sample surfaces, the tip-surface interaction increased the stability of the CNT tip.