Probabilistic logical approach for testing diagnosability of stochastic discrete event systems
Probabilistic logical approach for testing diagnosability of stochastic discrete event systems
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用于测试随机离散事件系统可诊断性的概率逻辑方法
DOI:
10.1016/j.engappai.2016.03.008
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发表时间:
2016-08
影响因子:
8
通讯作者:
Hao, Shuang
中科院分区:
文献类型:
--
作者:
Geng, Xuena;Ouyang, Dantong;Zhao, Xiangfu;Hao, Shuang
Fault diagnosis plays an important role in the prevention of harmful events in discrete event systems (DESs). Stochastic DES (SDES) is a more precise formulation of DES. In this paper, a novel approach that uses probabilistic logic to diagnose SDES is investigated. SDES is formalized as a set of probabilistic logical formulas. Moreover, a logical diagnoser is presented. Fault diagnosis of SDES has two properties: A-diagnosability and AA-diagnosability. On the basis of resolution principle, an algorithm is proposed to test A-diagnosability and AA-diagnosability of the SDES. Experimental results demonstrate that our algorithm improves the accuracy and efficiency of verifying diagnosability of SDES.
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DOI:
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发表时间:
2004-08
期刊:
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影响因子:
--
作者:
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通讯作者:
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1999-03
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影响因子:
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影响因子:
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通讯作者:
M. Sampath;R. Sengupta;S. Lafortune;K. Sinnamohideen;D. Teneketzis