Probabilistic logical approach for testing diagnosability of stochastic discrete event systems

Probabilistic logical approach for testing diagnosability of stochastic discrete event systems
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用于测试随机离散事件系统可诊断性的概率逻辑方法

DOI:
10.1016/j.engappai.2016.03.008
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发表时间:
2016-08
影响因子:
8
通讯作者:
Hao, Shuang
Hao, Shuang
中科院分区:
计算机科学2区
文献类型:
--
作者:
Geng, Xuena;Ouyang, Dantong;Zhao, Xiangfu;Hao, Shuang

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在离散事件系统(DES)中,故障诊断在有害事件的预防中起着重要的作用。随机DES(SDES)是DES的一种更精确的形式。本文提出了一种基于概率逻辑的SDES故障诊断方法。SDES被形式化为一组概率逻辑公式。此外,提出了一种逻辑诊断器。SDES的故障诊断具有两个性质:A-可诊断性和AA-可诊断性。在归结原理的基础上,提出了一种测试SDES的A-可诊断性和AA-可诊断性的算法。实验结果表明,该算法提高了SDES可诊断性验证的准确性和效率。
Fault diagnosis plays an important role in the prevention of harmful events in discrete event systems (DESs). Stochastic DES (SDES) is a more precise formulation of DES. In this paper, a novel approach that uses probabilistic logic to diagnose SDES is investigated. SDES is formalized as a set of probabilistic logical formulas. Moreover, a logical diagnoser is presented. Fault diagnosis of SDES has two properties: A-diagnosability and AA-diagnosability. On the basis of resolution principle, an algorithm is proposed to test A-diagnosability and AA-diagnosability of the SDES. Experimental results demonstrate that our algorithm improves the accuracy and efficiency of verifying diagnosability of SDES.
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