Investigation of the secondary emission characteristics of CVD diamond films for electron amplification
Investigation of the secondary emission characteristics of CVD diamond films for electron amplification
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DOI：
10.1016/j.nima.2009.05.195
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发表时间：
2009-10
影响因子：
1.4
通讯作者：
J. Lapington;D. Thompson;P. W. May;N. A. Fox;J. Howorth;J. Milnes;V. Taillandier
中科院分区：
文献类型：
--
作者：
J. Lapington;D. Thompson;P. W. May;N. A. Fox;J. Howorth;J. Milnes;V. Taillandier
化学气相沉积（CVD）金刚石作为一种低成本、高产量、易于制造的二次电子发射体，在光电倍增管等器件中具有巨大的潜力。其高二次电子产率的潜力为这些器件提供了几个显着的好处，包括更高的时间分辨率，更快的信号上升时间，降低脉冲高度分布，低噪声和化学稳定性。我们描述了用不同工艺和工艺参数制备的CVD金刚石的二次发射产率的实验，并讨论了二次电子产率的退化和由于不必要的电子束诱导污染而遇到的实验困难。我们描述了用于克服这些困难的技术，并介绍了在反射模式下CVD金刚石节点的二次产率的测量。我们讨论了CVD金刚石dynode技术在反射和透射模式下在先进高速成像和光子计数探测器上的应用，并描述了该领域的未来发展计划。
Chemical vapour deposition (CVD) diamond offers great potential as a low-cost, high-yield, easily manufactured secondary electron emitter for electron multiplication in devices such as photomultiplier tubes. Its potential for high secondary electron yield offers several significant benefits for these devices including higher time resolution, faster signal rise time, reduced pulse height distribution, low noise, and chemical stability. We describe an experiment to characterize the secondary emission yield of CVD diamond manufactured using different processes and process parameters and discuss the degradation of secondary electron yield and experimental difficulties encountered due to unwanted electron beam-induced contamination. We describe techniques utilized to overcome these difficulties, and present measurements of secondary yield from CVD diamond dynodes in reflection mode. We discuss the application of CVD diamond dynode technology, both in reflection and transmission mode, to advanced high-speed imaging and photon-counting detectors and describe future plans in this area.