Mapping the flux penetration profile in a 2G-HTS tape at the microscopic scale: deviations from a classical critical state model

Mapping the flux penetration profile in a 2G-HTS tape at the microscopic scale: deviations from a classical critical state model
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DOI:
10.1088/1361-6668/aaf2f5
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发表时间:
2019-02-01
影响因子:
3.6
通讯作者:
Bending, Simon J.
Bending, Simon J.
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
Marchiori, Estefani;Bending, Simon J.

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Understanding vortex behaviour at microscopic scales is of extreme importance for the development of higher performance coated conductors with larger critical currents. Here, we study and map the critical state in a YBCO-based coated conductor at different temperatures using two distinct operation modes of scanning Hall microscopy. An analytical Bean critical state model for long superconducting strips is compared with our measurements and used to estimate the critical current density. We find several striking deviations from the model; pronounced flux front roughening is observed as the temperature is reduced below 83 K due to vortex-bundle formation when strong broadening of the flux front profile is also seen. In higher magnetic fields at the lower temperature of 65 K, fishtail-like magnetization peaks observed in local magnetization measurements are attributed to flux-locking due to an increase in the critical current density near the edges of the tape, which we tentatively link to vortex pinning matching effects. Our measurements provide valuable insights into the rich vortex phenomena present in coated conductor tapes at the microscopic scale.