Characterization of Sputtered CdTe Thin Films with Electron Backscatter Diffraction and Correlation with Device Performance
Characterization of Sputtered CdTe Thin Films with Electron Backscatter Diffraction and Correlation with Device Performance
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DOI：
10.1017/s143192761500077x
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发表时间：
2015-08-01
影响因子：
2.8
通讯作者：
Liu, Xiangxin
中科院分区：
文献类型：
--
作者：
Nowell, Matthew M.;Scarpulla, Michael A.;Liu, Xiangxin
预期多晶CdTe光伏薄膜的性能取决于薄膜微结构的晶界密度和相应的晶粒尺寸。然而，这些薄膜内晶界的电性能还没有很好地理解，并且在薄膜性能方面可能是有益的、有害的或中性的。电子背散射衍射已被用来表征的晶粒尺寸，晶界结构，和晶体学织构溅射碲化镉在不同的沉积压力之前和之后氯化镉处理，以相关的性能与微观结构。在沉积态薄膜中观察到弱的纤维织构，在较低的沉积压力下存在（111）织构，在较高的沉积压力下观察到（110）织构。氯化镉处理的样品表现出显着的晶粒再结晶与高分数的孪晶界。太阳能电池效率的良好的相关性，观察到与孪晶校正的晶粒尺寸，而不良的相关性被发现，如果孪晶界被认为是晶界的晶粒尺寸的测定。这意味着孪晶界对于复合和载流子输运是中性的。
The performance of polycrystalline CdTe photovoltaic thin films is expected to depend on the grain boundary density and corresponding grain size of the film microstructure. However, the electrical performance of grain boundaries within these films is not well understood, and can be beneficial, harmful, or neutral in terms of film performance. Electron backscatter diffraction has been used to characterize the grain size, grain boundary structure, and crystallographic texture of sputtered CdTe at varying deposition pressures before and after CdCl2 treatment in order to correlate performance with microstructure. Weak fiber textures were observed in the as-deposited films, with (111) textures present at lower deposition pressures and (110) textures observed at higher deposition pressures. The CdCl2-treated samples exhibited significant grain recrystallization with a high fraction of twin boundaries. Good correlation of solar cell efficiency was observed with twin-corrected grain size while poor correlation was found if the twin boundaries were considered as grain boundaries in the grain size determination. This implies that the twin boundaries are neutral with respect to recombination and carrier transport.