High-energy electron irradiation effects in C60 films

High-energy electron irradiation effects in C60 films
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C60 薄膜中的高能电子辐照效应

DOI:
10.1063/1.373112
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发表时间:
2000
期刊:
影响因子:
--
通讯作者:
O. Goetzberger
O. Goetzberger
中科院分区:
--
文献类型:
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作者:
Aurangzeb Khan;N. Kojima;M. Yamaguchi;K. L. Narayanan;O. Goetzberger

文献摘要

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本文报道了高能(1mev)电子辐照对C60薄膜的影响。傅里叶变换红外光谱、拉曼光谱和x射线衍射结果是一致的,并提供了C60分子在辐照下不破坏的明确证据。三种技术的光谱中都存在C60特征峰,这表明C60薄膜在低能辐照下还没有转变成迄今为止提出的非晶碳结构。人们提出了一个非常短的碰撞时间机制来解释这一观察结果。
We report here the high-energy (1 MeV) electron irradiation effects on C60 films. Fourier transform infrared spectroscopy, Raman spectroscopy, and x-ray diffraction results are consistent and provide clear evidence of the nondestruction of C60 molecules upon irradiation. The presence of C60 signature peaks in the spectra of all three techniques indicates that the C60 films have not been transformed into a hitherto proposed structure of amorphous carbon for low-energy irradiation. A very short collision time mechanism has been proposed to explain the observation.