Chemical Microscopy of Surfaces by Sum Frequency Generation Imaging
Chemical Microscopy of Surfaces by Sum Frequency Generation Imaging
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DOI：
10.1021/jp904015s
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发表时间：
2009-09-24
影响因子：
3.7
通讯作者：
Baldelli, Steven
中科院分区：
文献类型：
--
作者：
Cimatu, Katherine A.;Baldelli, Steven
从金属表面的自组装单层到金属表面暴露于腐蚀性物质（氰化物溶液）后的反应，求和频率生成成像显微镜已经开发并应用于不同的系统。它还通过使用映射分析来帮助理解异质性的基本问题，该分析认为在选定的感兴趣区域中获得的频谱独立于其相邻的roi。利用和改进了显微镜的结构，以适应其空间分辨率、信噪比和更快的积累时间的提高。后一个方面更多地取决于要分析的样品的种类。最后，该衍射极限显微镜目前的分辨率约为2 μ m，要达到接近800 nm的最终分辨率，仍有一定的改进空间。本研究的主要和最终目标是根据表面和底物本身吸附分子的化学性质提供化学灵敏度、界面特异性和二维图像。
Sum frequency generation imaging microscopy has been developed and implemented in different systems from self-assembled monolayer on metal surfaces to reaction of a metal surface upon exposure to a corrosive material (cyanide solution). It also helped the fundamental issues of heterogeneity to be understood by using mapping analysis that considers an acquired spectrum in a chosen region-of-interest to be independent of its neighboring ROIs. The construction of the microscope has been utilized and modified to accommodate the improvement of its spatial resolution, signal-to-noise ratio, and faster accumulation time. The latter aspect is more dependent toward the kind of sample to be analyzed. Finally, the current resolution of this diffraction-limited microscope is similar to 2 mu m and there is still some room for improvement to reach its ultimate resolution of similar to 800 nm. The main and final goal of this study is to provide chemical sensitivity, interfacial specificity, and a two-dimensional image based on the chemical properties of the adsorbed molecules on the surface and also the substrate itself.