Scan-less confocal phase imaging based on dual-comb microscopy
Scan-less confocal phase imaging based on dual-comb microscopy
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DOI：
10.1364/optica.5.000634
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发表时间：
2018-05-20
期刊：
影响因子：
10.4
通讯作者：
Yasui, Takeshi
中科院分区：
文献类型：
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作者：
Hase, Eiji;Minamikawa, Takeo;Yasui, Takeshi
共焦激光显微镜 (CLM) 是生命科学研究和工业检测中的强大工具，因为它提供具有微米深度选择性的二维光学切片或三维成像功能。此外，无扫描成像方式可实现快速图像采集，并且对 CLM 中的周围外部干扰具有高鲁棒性。然而，要测量的物体必须是反射性、吸收性、散射性或荧光性的，因为图像对比度是由光强度决定的。如果光学相位可以提供新的图像对比度，则通过提供折射率、光学厚度或几何形状的信息，无扫描CLM可以进一步应用于透明非荧光物体或具有纳米不均匀性的反射物体。在这里，我们报告了无扫描共焦双梳显微镜，通过使用光学频率梳作为具有离散超多通道的幅度和相位的光学载体，除了具有深度选择性的幅度图像之外，还提供相位图像。我们的技术将样本的共焦幅度和相位图像编码到光学频率梳中的一系列离散模式上，具有明确的幅度和相位，以在图像像素和梳模式之间建立一一对应关系。然后，该技术通过振幅和相位从梳状模式解码这些图像。我们展示了在毫秒时间尺度上微米深度选择性下具有毫弧度相位分辨率的共焦相位成像。作为概念证明，我们展示了静置培养固定细胞的定量相位成像和纳米级台阶结构的表面形貌。我们的共焦相位成像技术将在培养中堆叠活细胞的三维可视化和半导体物体的纳米表面形貌中找到应用。 (c) 2018 年美国光学协会根据 OSA 开放获取出版协议的条款
Confocal laser microscopy (CLM) is a powerful tool in life science research and industrial inspection because it offers two-dimensional optical sectioning or three-dimensional imaging capability with micrometer depth selectivity. Furthermore, scan-less imaging modality enables rapid image acquisition and high robustness against surrounding external disturbances in CLM. However, the objects to be measured must be reflective, absorptive, scattering, or fluorescent because the image contrast is given by the optical intensity. If a new image contrast can be provided by the optical phase, scan-lessCLM can be further applied for transparent non-fluorescent objects or reflective objects with nanometer unevenness by providing information on refractive index, optical thickness, or geometrical shape. Here, we report scanless confocal dual-comb microscopy offering a phase image in addition to an amplitude image with depth selectivity by using an optical frequency comb as an optical carrier of amplitude and phase with discrete ultra-multichannels. Our technique encodes confocal amplitude and phase images of a sample onto a series of discrete modes in the optical frequency comb with well-defined amplitude and phase to establish a one-to-one correspondence between image pixels and comb modes. The technique then decodes these images from comb modes with amplitude and phase. We demonstrate confocal phase imaging with milliradian phase resolution under micrometer depth selectivity on the millisecond timescale. As a proof of concept, we demonstrate the quantitative phase imaging of standing culture fixed cells and the surface topography of nanometer-scale step structures. Our technique for confocal phase imaging will find applications in three dimensional visualization of stacked living cells in culture and nanometer surface topography of semiconductor objects. (c) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement