Particle detection and classification using commercial off the shelf CMOS image sensors
Particle detection and classification using commercial off the shelf CMOS image sensors
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DOI：
10.1016/j.nima.2016.04.072
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发表时间：
2016-08-11
影响因子：
1.4
通讯作者：
Gomez Berisso, Mariano
中科院分区：
文献类型：
--
作者：
Perez, Martin;Lipovetzky, Jose;Gomez Berisso, Mariano
在本文中，我们分析了两种不同的商用 CMOS 图像传感器作为颗粒探测器的响应。使用来自不同来源的 X 射线光子、伽马光子、β 粒子和 α 粒子照射传感器。比较不同颗粒产生的电荷量以及传感器上记录的斑点大小，并通过算法进行分析以对它们进行分类。对于已知的入射能谱，所采用的传感器提供的剂量分辨率低于微格雷，显示出它们在辐射防护、区域监测或医疗应用中的潜力。 (C) 2016 Elsevier B.V. 保留所有权利。
In this paper we analyse the response of two different Commercial Off The shelf CMOS image sensors as particle detectors. Sensors were irradiated using X-ray photons, gamma photons, beta particles and alpha particles from diverse sources. The amount of charge produced by different particles, and the size of the spot registered on the sensor are compared, and analysed by an algorithm to classify them. For a known incident energy spectrum, the employed sensors provide a dose resolution lower than microGray, showing their potentials in radioprotection, area monitoring, or medical applications. (C) 2016 Elsevier B.V. All rights reserved.