Far-field free tapping-mode tip-enhanced Raman microscopy
Far-field free tapping-mode tip-enhanced Raman microscopy
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DOI：
10.1063/1.4799496
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发表时间：
2013-03
影响因子：
4
通讯作者：
Jun Yu;Y. Saito;T. Ichimura;S. Kawata;P. Verma
中科院分区：
文献类型：
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作者：
Jun Yu;Y. Saito;T. Ichimura;S. Kawata;P. Verma
基于原子力显微镜的双模式工作原理，研制了一种针尖增强拉曼散射显微镜。通过使多通道检测器与金属纳米尖端的轻敲振荡同步，可以测量尖端-样品分离相关的TERS光谱，并在尖端的周期性振荡期间动态地获得近场和远场拉曼信号。这有助于TERS成像，并在原位逐点去除远场背景，从而提高TERS成像的对比度。此外，我们可以获得8 nm的极高空间分辨率。此外，轻敲模式操作的尖端有一个额外的优点，低样品损伤，这可能是重要的未来应用TERS软生物材料。我们的TERS成像技术使我们能够以更快的成像速度和极高的空间分辨率构建无远场的高对比度近场图像。
A tip-enhanced Raman scattering (TERS) microscope has been developed, which is based on the tapping-mode operation of atomic force microscopy. By synchronizing a multichannel detector with tapping oscillation of the metallic nanotip, one can measure a tip-sample separation dependent TERS spectrum and dynamically obtain both near- and far-field Raman signals during the periodic oscillation of the tip. This facilitates TERS imaging with in situ point-by-point removal of far-field background, resulting in higher contrast in TERS imaging. Furthermore, we can obtain an extremely high spatial resolution of 8 nm. Also, tapping mode operation of tip has an added advantage of low sample damage, which could be important for future application of TERS to soft biological materials. Our TERS imaging technique enables us to construct far-field-free high-contrast near-field image at faster imaging speed with extremely high spatial resolution.