Structural Features of Sm1-XEuXS Thin Polycrystalline Films
Structural Features of Sm1-XEuXS Thin Polycrystalline Films
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Sm1-XEuXS 多晶薄膜的结构特征
DOI：
10.1134/s1063782617060124
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发表时间：
2017
期刊：
影响因子：
0.7
通讯作者：
and S.Hirai
中科院分区：
文献类型：
--
作者：
V.Kaminskii S.Solov’ev;G.Khavrov;N.Sharenkova;and S.Hirai
用蒸发法制备了Sm_（1-x）Eu_xS（x= 0.1，0.167，0.2，0.25，0.33，0.5）多晶薄膜。研究了薄膜的结构特征。研究了Eu掺杂浓度和薄膜沉积温度对X射线相干散射区的晶格参数和尺寸的影响。结果表明，Sm_（1-x）Eu_xS薄膜的形成是根据SmS薄膜的理论进行的，并且Sm ~（1-x）Eu_xS薄膜的晶格参数的变化可以用Sm ~（1-x）Eu_xS的变价态来解释。
Thin polycrystalline Sm1–xEuxS films (x= 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of X-гау coherent scattering regions was studied. It is shown that formation of Sm1–xEuxS films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.