Tip-enhanced nano-Raman analytical imaging of locally induced strain distribution in carbon nanotubes
Tip-enhanced nano-Raman analytical imaging of locally induced strain distribution in carbon nanotubes
复制标题
DOI：
10.1038/ncomms3592
复制
发表时间：
2013-10-01
影响因子：
16.6
通讯作者：
Kawata, Satoshi
中科院分区：
文献类型：
--
作者：
Yano, Taka-aki;Ichimura, Taro;Kawata, Satoshi
尖端增强拉曼散射显微镜是一种分析纳米材料的强大技术，其空间分辨率远远超过光的衍射极限。然而，即使用尖端增强的拉曼散射显微镜，也还没有实现对材料的固有性质，如单个分子或局部结构的成像。在这里，我们演示了碳纳米管长度方向应变分布的彩色编码尖端增强拉曼散射成像。这种应变是通过用原子力显微镜尖端拖动纳米管来诱导的。一个镀银的纳米针尖被用来增强和检测位于针尖正下方的纳米管的特定位置的拉曼散射，表示由于局部应变的存在而导致其分子排列的变形。我们的技术显著地提供了对纳米材料结构性质局部变化的洞察，这可能被证明对碳纳米管和其他纳米材料作为功能器件和材料的各种应用有用。
Tip-enhanced Raman scattering microscopy is a powerful technique for analysing nanomaterials at high spatial resolution far beyond the diffraction limit of light. However, imaging of intrinsic properties of materials such as individual molecules or local structures has not yet been achieved even with a tip-enhanced Raman scattering microscope. Here we demonstrate colour-coded tip-enhanced Raman scattering imaging of strain distribution along the length of a carbon nanotube. The strain is induced by dragging the nanotube with an atomic force microscope tip. A silver-coated nanotip is employed to enhance and detect Raman scattering from specific locations of the nanotube directly under the tip apex, representing deformation of its molecular alignment because of the existence of local strain. Our technique remarkably provides an insight into localized variations of structural properties in nanomaterials, which could prove useful for a variety of applications of carbon nanotubes and other nanomaterials as functional devices and materials.