HOT-ELECTRON PICTURE OF LIGHT-EMISSION FROM TUNNEL-JUNCTIONS
HOT-ELECTRON PICTURE OF LIGHT-EMISSION FROM TUNNEL-JUNCTIONS
复制标题
DOI：
10.1103/physrevb.27.4601
复制
发表时间：
1983-01-01
影响因子：
3.7
通讯作者：
DIMARIA, DJ
中科院分区：
文献类型：
--
作者：
KIRTLEY, JR;THEIS, TN;DIMARIA, DJ
金属-绝缘体-金属隧道结在2-4V的电压范围内偏置时会发射光辐射。我们认为，这种辐射过程的完整图景包括热电子，它激发表面电磁共振，然后通过表面粗糙度与外部辐射耦合。对发射强度的温度和第二金属电极厚度的测量，以及由光抽运和电荷注入激发的表面等离子体的光发射，支持了这一图景。
Metal-insulator-metal tunnel junctions emit optical radiation when biased at voltages in the range 2-4 V. We argue that a complete picture of this radiation process includes hot electrons, which excite surface electromagnetic resonances, which are in turn coupled to external radiation through surface roughness. This picture is supported by measurements of the temperature and second-metal-electrode thickness dependence of the emission intensities, and by light emission from surface plasmons excited by optical pumping and by charge injection.