Toward Reliable Industrial Radiation Thermometry

Toward Reliable Industrial Radiation Thermometry
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DOI:
10.1007/s10765-015-1870-y
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发表时间:
2015-08-01
影响因子:
2.2
通讯作者:
Ishii, J.
Ishii, J.
中科院分区:
工程技术4区
文献类型:
--
作者:
Yamada, Y.;Ishii, J.

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随着低成本红外测温仪和热成像仪的广泛使用,辐射测温在工业场景中的应用正在迅速增加。然而,它们的性能并不总是达到用户的期望。这通常是由于缺乏关于仪器性能和辐射测温本身局限性的适当信息。在本文中,揭示了这些限制,即温度计的瞄准能力,包括热成像仪的源尺寸效应、反射误差和测量对象的未知发射率。本文介绍了在NMIJ所作的努力,其目的是减轻这些困难的影响。双色辐射温度计由于其技术的复杂性,在溯源链和标准化工作中一直被忽视。介绍了将它们有效地纳入校准链和建立国际标准的最新活动。校准具有固定仪器发射率设置的低成本温度计一直是校准实验室的一个问题。描述了能够校准此类仪器的简单装置。提出了利用辅助光源补偿未知发射率的方法,实现了黑体条件,并将其应用于热像仪,克服了源尺寸效应和反射误差问题。将该技术扩展到具有镜面和散射表面的物体。这种努力在测温界受到鼓励,因为它们对于建立一个到工业前沿的不间断的可追溯链至关重要。
Application of radiation thermometry in industrial scenes is rapidly increasing with the widespread use of low-cost infrared thermometers and thermal imagers. However, their performances are not always up to the users' expectations. This is often due to lack of appropriate information on the limitations of the instrument performance and of radiation thermometry itself. In this article, these limitations are disclosed, namely the targeting capabilities of the thermometers including the size-of-source effect of thermal imagers, reflection errors, and unknown emissivity of the measurement object. Attempts made at the NMIJ are introduced, which aim at alleviating the effect of these difficulties. Two-color radiation thermometers have been neglected from the traceability chain and from standardization efforts due to their technical complexity. Recent activities to incorporate them effectively in the calibration chain and to establish international standards are presented. Calibration of low-cost thermometers with a fixed instrumental emissivity setting has been an issue for calibration laboratories. Simple apparatus that enables calibration of such instruments is described. Methods to compensate for unknown emissivities are presented utilizing auxiliary sources to realize a blackbody condition, which is applied to thermal imagers to overcome the problem of the size-of-source effect and reflection error at the same time. Extensions of the technique to objects with specular and scattering surfaces are described. Such efforts are encouraged in the thermometry community since they are essential in establishing an unbroken chain of traceability to the industrial front.