Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains
Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains
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DOI：
10.1016/j.ultramic.2010.12.019
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发表时间：
2011-03-01
期刊：
影响因子：
2.2
通讯作者：
Kolosov, Oleg V.
中科院分区：
文献类型：
--
作者：
Dinelli, Franco;Albonetti, Cristiano;Kolosov, Oleg V.
超薄有机薄膜的形成分析是一个非常重要的问题。事实上，众所周知，有机发光二极管和场效应晶体管的性能受到早期生长阶段的强烈影响。例如，在六噻吩的情况下，光致发光光谱和共焦显微镜间接证明了由主链平行于基材表面的分子组成的域的存在。相反，传统的接触式和间歇式接触模式的扫描力显微镜都未能检测到此类域。在本文中，我们展示了对纳米力学特性敏感的超声波力显微镜（UFM）可以直接识别亚单层厚膜的结构。首次以纳米级空间分辨率对六噻吩平坦域进行成像。为了解释 UFM 对比的起源及其优点，我们对侧向力和间歇接触模式进行了比较。特别是，它表明 UFM 非常适合需要对材料特性高灵敏度、低样本损坏和高空间分辨率的研究。 (C) 2010 Elsevier B.V. 保留所有权利。
The analysis of the formation of ultra-thin organic films is a very important issue. In fact, it is known that the properties of organic light emitting diodes and field effect transistors are strongly affected by the early growth stages. For instance, in the case of sexithiophene, the presence of domains made of molecules with the backbone parallel to the substrate surface has been indirectly evidenced by photoluminescence spectroscopy and confocal microscopy. On the contrary, conventional scanning force microscopy both in contact and intermittent contact modes have failed to detect such domains. In this paper, we show that Ultrasonic Force Microscopy (UFM), sensitive to nanomechanical properties, allows one to directly identify the structure of sub-monolayer thick films. Sexithiophene flat domains have been imaged for the first time with nanometer scale spatial resolution. A comparison with lateral force and intermittent contact modes has been carried out in order to explain the origins of the UFM contrast and its advantages. In particular, it indicates that UFM is highly suitable for investigations where high sensitivity to material properties, low specimen damage and high spatial resolution are required. (C) 2010 Elsevier B.V. All rights reserved.