The effect of nonmetallic element P in electroless Ni‐P coating on the passivation process during chemical conversion treatment
The effect of nonmetallic element P in electroless Ni‐P coating on the passivation process during chemical conversion treatment
复制标题
DOI：
10.1002/sia.5690
复制
发表时间：
2015-01
影响因子：
1.7
通讯作者：
S. Mu;Wenfang Li;Jun Du
中科院分区：
文献类型：
--
作者：
S. Mu;Wenfang Li;Jun Du
纯Ni和化学Ni-P涂层（ENPC）通过化学转化处理进行钝化。纯Ni和P含量分别为2.9，7.2和11.7at.%的ENPC表面均形成了钝化膜通过X射线光电子能谱（XPS）分析。高分辨率XPS还用于分析钝化膜中检测到的元素的化学状态。结果表明，在钝化膜中检测到的Ni和P均为单质态，未检测到含有Ni和P元素的化合物，说明Ni和P不参与钝化膜的形成。钝化膜中成膜反应产物的含量随Ni-P镀层中P元素含量的增加而增加，表明Ni-P镀层中的非金属P在钝化膜的形成中起着重要作用。利用XPS分析了钝化膜的形成机理。版权所有© 2014约翰威利父子有限公司.
Pure Ni and electroless Ni‐P coating (ENPC) were passivated by a chemical conversion treatment. The passive films formed on pure Ni and ENPCs (with content of P 2.9, 7.2 and 11.7 at.% respectively) were analyzed by X‐ray photoelectron spectroscopy (XPS). High‐resolution XPS was also used to analyze the chemical states of the elements detected in the passive films. The results indicated that the detected Ni and P were in elemental states, and no compound with Ni and P element was detected in passive film, meaning that Ni and P did not participate in the formation of the passive film. The content of film‐forming reaction product in passive film increases with the content of element P in Ni‐P coating, suggesting that the nonmetallic P in Ni‐P coating played an important role in the formation of the passive film. The XPS results were used to analyze the formation mechanism of the passive film. Copyright © 2014 John Wiley & Sons, Ltd.