A novel cleaning method of gold-coated atomic force microscope tips for their chemical modification
A novel cleaning method of gold-coated atomic force microscope tips for their chemical modification
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DOI：
10.1016/s0304-3991(99)00144-8
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发表时间：
2000-02-01
期刊：
影响因子：
2.2
通讯作者：
Akiba, U
中科院分区：
文献类型：
--
作者：
Fujihira, M;Okabe, Y;Akiba, U
研究了用硫醇或硫化物对金包膜原子力显微镜针尖进行化学改性的两步预清洗工艺。两步清洗程序包括(i)用臭氧处理氧化原子力显微镜尖端上的有机污染物和（ii）通过将氧化尖端浸入约65摄氏度的纯热乙醇中来还原氧化的金表面。通过两步程序预先清洗的涂有金的原子力显微镜尖端制备的化学修饰尖端与工厂中金气相沉积后立即进行化学修饰的尖端几乎具有相同的尖端特性。目前的两步清洗程序可广泛用于化学力显微镜用硫醇或二硫化合物对市售的金涂层AFM尖端进行化学改性。(C) 2000由Elsevier Science B.V.出版，版权所有。
For chemical modification of gold-coated AFM tips with thiol or sulfide compounds, a new two-step precleaning procedure was studied. The two-step cleaning procedure involves (i) oxidation of organic contaminants on the AFM tips with ozone treatment and (ii) reduction of the oxidized gold surface by immersing the oxidized tip into pure hot ethanol at ca. 65 degrees C. The chemically modified tips prepared from gold-coated AFM tips precleaned by the two-step procedure gave almost the same tip characteristics as those chemically modified immediately after gold vapor deposition in a factory. The present two-step cleaning procedure can be used widely for chemical modification of commercially available gold-coated AFM tips with thiol or disulfide compounds for chemical force microscopy. (C) 2000 Published by Elsevier Science B.V. All rights reserved.