Efficient focusing of hard x rays to 25nm by a total reflection mirror
Efficient focusing of hard x rays to 25nm by a total reflection mirror
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DOI:
10.1063/1.2436469
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发表时间:
2007-01
影响因子:
4
通讯作者:
H. Mimura;H. Yumoto;S. Matsuyama;Y. Sano;K. Yamamura;Y. Mori;M. Yabashi;Y. Nishino;K. Tamasaku;T. Ishikawa;K. Yamauchi
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文献类型:
--
作者:
H. Mimura;H. Yumoto;S. Matsuyama;Y. Sano;K. Yamamura;Y. Mori;M. Yabashi;Y. Nishino;K. Tamasaku;T. Ishikawa;K. Yamauchi
Nanofocused x rays are indispensable because they can provide high spatial resolution and high sensitivity for x-ray nanoscopy/spectroscopy. A focusing system using total reflection mirrors is one of the most promising methods for producing nanofocused x rays due to its high efficiency and energy-tunable focusing. The authors have developed a fabrication system for hard x-ray mirrors by developing elastic emission machining, microstitching interferometry, and relative angle determinable stitching interferometry. By using an ultraprecisely figured mirror, they realized hard x-ray line focusing with a beam width of 25nm at 15keV. The focusing test was performed at the 1-km-long beamline of SPring-8.