The deglacial history of NW Alexander Island, Antarctica, from surface exposure dating
The deglacial history of NW Alexander Island, Antarctica, from surface exposure dating
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南极洲亚历山大岛西北部的冰消历史，来自地表暴露测年
DOI：
10.1016/j.yqres.2011.11.012
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发表时间：
2012
影响因子：
2.3
通讯作者：
F. Stuart
中科院分区：
文献类型：
--
作者：
Joanne S. Johnson;J. Everest;P. Leat;N. Golledge;D. Rood;F. Stuart
南极半岛边缘最近的沿着变化，如威尔金斯冰架的崩塌，突出了气候变暖对南极半岛冰盖的影响。然而，如果我们要理解这些变化对南极冰盖未来稳定的意义，就必须从长期（千年尺度）的角度来看待这些变化。为了解决这个问题，我们提出了9个新的宇宙成因10 Be暴露年龄从网站上西北亚历山大岛和罗斯柴尔德岛（毗邻威尔金斯冰架），提供限制的时间变薄的亚历山大岛冰帽自末次冰期以来。所有的10 Be年龄，但一个是在10.2-21.7 ka的范围内，显示出一个总的趋势，逐步冰盖变薄，因为至少22 ka，直到10 ka。这些数据还提供了一个最小的估计（490米）的冰盖厚度在西北亚历山大岛在末次冰期最大。宇宙成因的3 He年龄从一个罕见的发生在罗斯柴尔德岛的地幔捕虏体产量可变的年龄高达46万年，可能反映了折返冰缘过程。
Recent changes along the margins of the Antarctic Peninsula, such as the collapse of the Wilkins Ice Shelf, have highlighted the effects of climatic warming on the Antarctic Peninsula Ice Sheet (APIS). However, such changes must be viewed in a long-term (millennial-scale) context if we are to understand their significance for future stability of the Antarctic ice sheets. To address this, we present nine new cosmogenic 10Be exposure ages from sites on NW Alexander Island and Rothschild Island (adjacent to the Wilkins Ice Shelf) that provide constraints on the timing of thinning of the Alexander Island ice cap since the last glacial maximum. All but one of the 10Be ages are in the range 10.2–21.7 ka, showing a general trend of progressive ice-sheet thinning since at least 22 ka until 10 ka. The data also provide a minimum estimate (490 m) for ice-cap thickness on NW Alexander Island at the last glacial maximum. Cosmogenic 3He ages from a rare occurrence of mantle xenoliths on Rothschild Island yield variable ages up to 46 ka, probably reflecting exhumation by periglacial processes.
影响因子：
4
作者：
D. Hodgson;S. Roberts;M. J. Bentley;James R. Smith;Joanne S. Johnson;E. Verleyen;W. Vyverman;A. Hodson;M. Leng;A. Cziferszky;A. Fox;D. Sanderson
通讯作者：
D. Hodgson;S. Roberts;M. J. Bentley;James R. Smith;Joanne S. Johnson;E. Verleyen;W. Vyverman;A. Hodson;M. Leng;A. Cziferszky;A. Fox;D. Sanderson