Cross sections for electron-impact single ionization of Kr8+ and Xe8+
Cross sections for electron-impact single ionization of Kr8+ and Xe8+
复制标题
Kr8 和 Xe8 电子轰击单次电离的横截面
DOI：
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发表时间：
1988
期刊：
影响因子：
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通讯作者：
Gregory
中科院分区：
文献类型：
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作者：
Bannister;Mueller;Wang;Pindzola;Griffin;Gregory
使用交叉束方法测量了 Kr/sup 8+/ 和 Xe/sup 8+/ 离子的电子轰击单电离的绝对截面，其能量低于电离阈值至 1500 eV。 Kr/sup 8+/ 和 Xe/sup 8+/ 离子束的很大一部分处于亚稳态配置。将地面离子和第一激发配置中的离子的配置平均畸变波计算与实验数据进行比较。对于本研究中的两种离子，发现第一激发构型（包括亚稳态能级）的离子的激发自电离对总电离截面的贡献比基态离子大得多。计算了 Kr/sup 8+/ 的麦克斯韦速率系数，并与已发表的结果进行比较。
Absolute cross sections for electron-impact single ionization of Kr/sup 8+/ and Xe/sup 8+/ ions were measured for energies below the ionization thresholds to 1500 eV using the crossed-beams method. A significant fraction of the Kr/sup 8+/ and Xe/sup 8+/ ion beams were in metastable configurations. Configuration-average distorted-wave calculations for ions in the ground and first-excited configurations are compared to the experimental data. For both ions in this study, the excitation-autoionization contribution to the total ionization cross section is found to be much larger for ions in the first-excited configuration, which includes metastable levels, than for the ground-state ions. Maxwellian rate coefficients were calculated for Kr/sup 8+/ and are compared to published results.