Pressure study of an antiferromagnet, CeMg2Cu9
Pressure study of an antiferromagnet, CeMg2Cu9
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反铁磁体 CeMg2Cu9 的压力研究
DOI：
10.1088/0953-8984/14/14/101
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发表时间：
2002
期刊：
影响因子：
--
通讯作者：
Y. Ōnuki
中科院分区：
文献类型：
--
作者：
H. Nakawaki;Y. Inada;R. Asai;M. Yamada;T. Okubo;S. Ikeda;A. Thamizhavel;Tatsuo C. Kobayashi;R. Settai;E. Yamamoto;Y. Ōnuki
我们研究了压力对六方晶系反铁磁体 CeMg2Cu9 电阻率的影响。该结构由沿[0001]方向交替的MgCu2 Laves型和CeCu5型层构成。环境压力下的Nel温度TN = 2.7?K随着压力p的增加而降低，并在临界压力pc2.5?GPa处消失。相应地，残余电阻率δ0和费米液体关系式中的系数Aδ = ?0 + AT2 被发现在 pc 附近有最大值。
We have studied the effect of pressure on the electrical resistivity of the antiferromagnet CeMg2Cu9 which crystallizes in the hexagonal structure. The structure is built up of alternating MgCu2 Laves-type and CeCu5-type layers along the [0001] direction. The N?el temperature TN = 2.7?K at ambient pressure decreases with increasing pressure p and disappears at a critical pressure pc2.5?GPa. Correspondingly, the residual resistivity ?0 and the coefficient A in a Fermi-liquid relation ? = ?0 + AT2 are found to have maximum values around pc.
影响因子：
2.8
作者：
Miyake, K;Narikiyo, O;Onishi, Y
通讯作者：
Onishi, Y