Electrical Characterization of n+-InSb/p-Si Heterojunctions Grown by Surface Reconstruction Controlled Epitaxy
Electrical Characterization of n+-InSb/p-Si Heterojunctions Grown by Surface Reconstruction Controlled Epitaxy
复制标题
表面重构控制外延生长的 n -InSb/p-Si 异质结的电学特性
DOI:
--
复制
发表时间:
2014
期刊:
影响因子:
--
通讯作者:
and K. Maezawa
中科院分区:
文献类型:
--
作者:
K. Kimura;K. Hosotani;T. Ito;H. Shimoyama;T. Sakamoto;M. Mori;and K. Maezawa