Effect of sample anisotropy on scanning near-field optical microscope images
Effect of sample anisotropy on scanning near-field optical microscope images
复制标题
样品各向异性对扫描近场光学显微镜图像的影响
DOI：
10.1063/5.0039632
复制
发表时间：
2021-02-28
影响因子：
3.2
通讯作者：
Liu, Mengkun
中科院分区：
文献类型：
--
作者：
Chui, S. T.;Chen, Xinzhong;Liu, Mengkun
散射型扫描近场光学显微镜（s-SNOM）已被广泛用于表征强相关电子、二维和等离子体材料，在生物领域具有巨大的应用潜力。许多这些材料表现出各向异性响应，使从s-SNOM测量中提取介电常数复杂化。在这里，我们推广了我们最近开发的从各向同性系统中提取近场散射信号的方法，并将其应用于各向异性介质。具体来说，我们将理论结果与在红外频率范围内表现出强共振的适度各向异性蓝宝石的实验测量结果进行了比较。与实验结果吻合较好。我们的结果对于理解介电介质中低阻尼、各向异性极化态的近场响应具有重要意义。
Scattering-type scanning near-field optical microscopy (s-SNOM) has been widely used to characterize strongly correlated electronic, two dimensional, and plasmonic materials, and it has enormous potential for biological applications. Many of these materials exhibit anisotropic responses that complicate the extraction of dielectric constants from s-SNOM measurements. Here, we generalize our recently developed approach for retrieving the near-field scattering signal from isotropic systems and apply it to anisotropic dielectrics. Specifically, we compare our theoretical results with experimental measurements on modestly anisotropic sapphire that exhibit strong resonances at the infrared frequency range. Good agreement with the experimental result is found. Our result is important for understanding the near-field response of low damping, anisotropic polaritonic states in dielectric media.