Neutrons-Induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation
Neutrons-Induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation
复制标题
中子诱发 IGBT 失效:被测器件数量对截面计算的影响
DOI:
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发表时间:
2013
影响因子:
1.8
通讯作者:
F. Saigné
中科院分区:
文献类型:
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作者:
A. Touboul;L. Foro;F. Wrobel;K. Guetarni;J. Boch;F. Saigné
Despite the long-term experience of space in testing and qualifying devices, an adaptation of existing guidelines is needed for atmospheric mass applications, especially to take into account the variability of power-devices failure cross-section.