PHONON MEAN FREE PATH IN SILICON BETWEEN 77 + 250DEGREESK

PHONON MEAN FREE PATH IN SILICON BETWEEN 77 + 250DEGREESK
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DOI:
10.1103/physrev.134.a235
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发表时间:
1964-01-01
期刊:
影响因子:
--
通讯作者:
HUBNER, K
HUBNER, K
中科院分区:
其他
文献类型:
--
作者:
GERETH, R;HUBNER, K

文献摘要

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对穿过 10 ohm cm p 型硅的传输声子阻力的测量表明相关热声子的声子平均自由程从 77 K 时的约 80 μ 变化到 250 K 时的 12 μ。这些值取决于评估方法。简化分析表明,低于 150 K,声子谱的纵向声学分支占主导地位。
Measurement of transmitted phonon drag across 10 ohm cm p-type silicon indicates a phonon mean free path of the relevant thermal phonons which varies from about 80 μ at 77 K to 12 μ at 250 K. The values depend on the method of evaluation. A simplified analysis suggests that below 150 K the longitudinal acoustic branch of the phonon spectrum is dominant.