Highly segmented thin microstrip detector with data-driven fast readout
Highly segmented thin microstrip detector with data-driven fast readout
复制标题
高度分段的薄微带探测器，具有数据驱动的快速读出功能
DOI：
10.1016/j.nima.2010.02.181
复制
发表时间：
2009
期刊：
影响因子：
--
通讯作者：
F. C. Collaboration
中科院分区：
文献类型：
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作者：
M. Bomben;F. C. Collaboration
2008年9月，Slim 5 [1]合作提交了一个低材料预算的硅演示器，用于在欧洲核子研究中心的PS-T9试验束上测试12 GeV/c质子。在参考望远镜内，放置两个不同的探测器作为受试器械（DUT）。第一个是4k像素的深N阱MAPS矩阵，采用130 nm CMOS技术开发，提供数字稀疏读出。另一个是高电阻率双面硅探测器，具有与探测器边缘成45°角的短条，由FSSR 2芯片读取。FSSR 2是Fermilab和INFN共同开发的128通道数据驱动快速读出芯片。在本文中，我们描述了后者的传感器，striplet的主要特点。测试的主要目标是测量条带的效率和分辨率。DAQ系统已充分利用FSSR 2读出芯片的数据驱动方法。
In September 2008 the Slim5 [1] collaboration submitted a low material budget silicon demonstrator to test with 12GeV/c protons, at the PS-T9 test-beam at CERN. Inside the reference telescope, two different detectors were placed as device under test (DUT). The first was a 4k-Pixel Matrix of Deep N Well MAPS, developed in a 130nm CMOS Technology, providing digital sparsified readout. The other one was a high resistivity double sided silicon detector, with short strips at 45° angle to the detector's edge, read out by the FSSR2 chip. The FSSR2 is a 128 channel data-driven fast readout chip developed by Fermilab and INFN. In this paper we describe the main features of latter sensor, the striplet. The primary goal of the test was to measure the efficiency and the resolution of the striplets. The data-driven approach of the FSSR2 readout chips has been fully exploited by the DAQ system.