An extension of the IEM/IEMM surface scattering model
An extension of the IEM/IEMM surface scattering model
复制标题
DOI：
10.1080/13616670109409787
复制
发表时间：
2001-07
期刊：
影响因子：
--
通讯作者：
J. Alvarez-Perez
中科院分区：
文献类型：
--
作者：
J. Alvarez-Perez
摘要积分方程模型（IEM）是在过去十年中发展起来的，自从Fung和Pan（1986年国际学术会议论文集）首次提出以来，IEM已被广泛应用。on Multiple Scattering of Waves in Random Media and Random Surface（PA：Pennsylvania州立大学出版社）第701-14页），它已成为微波遥感中最广泛用于粗糙表面散射的理论模型之一。该模型的目的是研究随机粗糙表面的散射比基尔霍夫或小扰动近似更一般的条件下。此外，IEM还包括二阶多重散射效应。IEM已经由其原始作者在两个后续版本中逐渐校正（Hsieh C-Y等人，1997 IEEE Trans. Geosci. Remote Sensing 35 901-9，Chen et al 2000 IEEE Trans. Geosci.遥感38 249-56）。然而，该模型在其目前的提法中仍然存在一些理论上的空白，需要进行新的修订。最重要的是，IEM在其目前的形式不减少在一般的收发分置的背景下，小扰动法（SPM）时，散射表面是稍微粗糙。多次散射机制的良好描述意味着单次散射的正确描述。迄今为止，IEM不满足这一条件。在这里提出的工作中，提出了一个修正版本的IEM再现SPM的小粗糙度。由于它也符合物理和几何光学的结果，这个新的积分方程模型是一个合适的候选人，以弥合基尔霍夫近似和SPM之间的差距。
Abstract The integral equation model (IEM) has been developed over the last decade and, since its first presentation by Fung and Pan (1986 Proc. Int. Symp. on Multiple Scattering of Waves in Random Media and Random Surface (PA: Pennsylvania State University Press) pp 701–14), it has become one of the theoretical models most widely used for rough surface scattering in microwave remote sensing. The aim of this model was the study of the scattering by random rough surfaces under more general conditions than the Kirchhoff or the small-perturbation approximations. Furthermore, the IEM was meant to include multiple-scattering effects at second order. The IEM has been gradually corrected in two later releases by its original authors (Hsieh C-Y et al 1997 IEEE Trans. Geosci. Remote Sensing 35 901–9, Chen et al 2000 IEEE Trans. Geosci. Remote Sensing 38 249–56). However, the model still presents several theoretical hiatuses in its current formulation which call for a new revision. Most importantly, the IEM in its current form does not reduce in the general bistatic context to the small-perturbation method (SPM) when the scattering surface is slightly rough. A good description of multiple-scattering mechanisms implies that the single scattering is correctly described. This condition is not met by IEM as given hitherto. In the work presented here, a corrected version of IEM reproducing SPM for small roughness is proposed. Since it is also compliant with the physical and geometrical optics results, this new integral equation model is an appropriate candidate to bridge the gap between the Kirchhoff approximation and the SPM.