Potential dependent structure of electric double layer faced to solid electrode surfaces analyzed by electrochemical frequency modulation atomic force microscopy
Potential dependent structure of electric double layer faced to solid electrode surfaces analyzed by electrochemical frequency modulation atomic force microscopy
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DOI：
10.7567/jjap.56.08la03
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发表时间：
2017-07
影响因子：
1.5
通讯作者：
K. Fukui;T. Utsunomiya;Y. Yokota
中科院分区：
文献类型：
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作者：
K. Fukui;T. Utsunomiya;Y. Yokota
本文综述了近年来电化学调频原子力显微镜（EC-FM-AFM）在电解质/电极界面双电层（EDL）分析方面的研究进展。EC-FM-AFM可以在低加载力下获得液体分子结构的液体侧信息以及固体侧的原子尺度分辨率。重点讨论了离子液体在水溶液/石墨界面上的电位和电解质依赖性以及界面离子液体结构对基底的强依赖性。
This progress review summarizes recent achievements on the analyses of electric double layer (EDL) formed at electrolyte/electrode interfaces by using electrochemical frequency modulation atomic force microscopy (EC-FM-AFM), which enables to obtain the liquid side information on the liquid molecules’ structuring as well as the atomic scale resolution of the solid side at low loading forces. Potential and electrolyte dependent EDL structures at aqueous solution/graphite interfaces and strong substrate dependency on the structuring of interfacial ionic liquid are mainly discussed.