Decay rates of almost strong modes in Floquet spin chains beyond Fermi's Golden Rule
Decay rates of almost strong modes in Floquet spin chains beyond Fermi's Golden Rule
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Floquet 自旋链中几乎强模式的衰减率超出费米黄金法则
作者：
Hsiu;A. Rosch;A. Mitra
研究了弱不可积Floquet自旋链中几乎强零模和$\pi$模的稳定性和动力学性质.这种模式也可以被看作是局部马约拉纳模式的边缘的拓扑超导体。用可积破缺相互作用强度J_z的微扰理论估计了这些模的衰变率，并与精确对角化方法得到的衰变率进行了比较。微扰理论的结构和模式的寿命取决于准能量模2 π/T$的守恒，其中T$是Floquet系统的周期。如果最小为4 n-1$的准粒子的准能量加起来为零（或$\pi/T$为$\pi$模式），则寿命与1/J_z^{2 n}$成正比。因此，寿命是敏感地控制的单粒子Floquet带的宽度。对于衰变率在$J_z$中是二次的区域，导出了衰变率关于可积模型的无限温度自相关函数的解析表达式，并与精确对角化结果一致。
The stability and dynamics of almost strong zero and $\pi$ modes in weakly non-integrable Floquet spin chains are investigated. Such modes can also be viewed as localized Majorana modes at the edge of a topological superconductor. Perturbation theory in the strength of integrability-breaking interaction $J_z$ is employed to estimate the decay rates of these modes, and compared to decay rates obtained from exact diagonalization. The structure of the perturbation theory and thus the lifetime of the modes is governed by the conservation of quasi-energy modulo $2 \pi/T$, where $T$ is the period of the Floquet system. If the quasi-energies of minimally $4 n-1$ quasi-particles adds up to zero (or $\pi/T$ for a $\pi$ mode), the lifetime is proportional to $1/J_z^{2 n}$. Thus the lifetime is sensitively controlled by the width of the single-particle Floquet bands. For regimes where the decay rates are quadratic in $J_z$, an analytic expression for the decay rate in terms of an infinite temperature autocorrelation function of the integrable model is derived, and shown to agree well with exact diagonalization.
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弱不可积边界杂质模型中缓慢衰减的零模式
影响因子：
3.7
作者：
Yeh, Hsiu-Chung;Cardoso, Gabriel;Korneev, Leonid;Sels, Dries;Abanov, Alexander G.;Mitra, Aditi
通讯作者：
Mitra, Aditi
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影响因子：
3.7
作者：
Mitra, Aditi;Yeh, Hsiu-Chung;Yan, Fei;Rosch, Achim
通讯作者：
Rosch, Achim
DOI：
10.1088/1742-5468/aa73f0
发表时间：
2017-06-01
影响因子：
2.4
作者：
Kemp, Jack;Yao, Norman Y.;Fendley, Paul
通讯作者：
Fendley, Paul
影响因子：
56.9
作者：
Mi, X.;Sonner, M.;Roushan, P.
通讯作者：
Roushan, P.