Valence band offset of MgO/4H-SiC heterojunction measured by x-ray photoelectron spectroscopy
Valence band offset of MgO/4H-SiC heterojunction measured by x-ray photoelectron spectroscopy
复制标题
X射线光电子能谱测量MgO/4H-SiC异质结的价带偏移
作者：
Sun, G. S.;Liu, X. L.;Yang, S. Y.;Wang, Z. G.;Wei, H. Y.;Zhang, B. L.;Zhang, P. F.;Zhu, Q. S.;Cai, F. F.;Fan, H. B.
